China's National Institute of Metrology Builds First High-Precision Roundness Reference Device, Reducing Uncertainty from 20nm to 6nm
China's National Institute of Metrology Builds First High-Precision Roundness Reference Device, Reducing Uncertainty from 20nm to 6nm
China's first high-precision roundness reference device has been developed and officially establishe...维度网 (en.wedoany.com)
